| E. Volkerink, Verigy |
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| S. Davidson, Oracle |
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| D. Armstrong, Advantest |
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| B. Brown, LTX-Credence |
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| A. Khoche, Khoche Consulting Services |
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| R. Kapur, Synopsys |
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| Y. Ma, Advantest |
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| A. Gold, Advantest |
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| F.-F. Ferhani, Broadcom |
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| D. Acharyya, Verigy |
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| R. Barth, Micron |
| P. Burlison, Verigy |
| K.-Y. Cho, NVIDIA |
| C. J. Clark, Intellitech |
| A. Evans, Broadcom |
| W. Fister, Micron |
| G. Fleeman, Advantest |
| B. Gage, Teradyne |
| M. Hafed, DFT Microsystems |
| R. Kapur, Synopsys |
| D. Keezer, GeorgiaTech |
| K. Lanier, Teradyne |
| R. Lesnikoski, Oracle |
| M. Loranger, FormFactor |
| Y. Ma, Advantest |
| J. Moreira, Verigy |
| P. Muhmenthaler, MUHMY Systems |
| J. Plusquellic, University of New Mexico |
| B. Price, NXP |
| M. Roos, Roos Instruments |
| J. Rivoir, Verigy |
| S. Tilden, LTX-Credence |
| C.W. Wu, Tsing Hua University |
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Keynote Speaker
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Octavio Martinez
Director of Test Engineering
QUALCOMM CDMA Technologies Division
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Octavio Martinez is in charge of product and test development for QUALCOMM'S Single Chip solution products. This family of chips integrate Digital, Analog, Power Management and RF into a single package. Further, Octavio is the Mixed Signal Test Engineering department manager. Octavio Martinez has been involved with ATE testing for over 16 years. He has experience in testing digital, analog, mixed signal and RF circuits. In his latest role, Octavio Martinez is in charge of test development for a SiP (System in Package)and SOC (System On Chip) devices that will keep QCOM in the forefront of technology. Octavio's professional interests include ATE (Automated Test Equipment) IC testing, COT (Cost of Test), DFT (Design for Test) and DFM (Design for Manufacturability. Prior to joining QUALCOMM, Octavio Martinez worked for Brooktree Corporation as a mixed signal test engineer. Octavio holds a B.S.E.E. and an M.B.A from San Diego State University.
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Register Now 
