| E. Volkerink, Verigy |
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| D. Armstrong, Advantest |
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| M. Loranger, FormFactor |
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| A. Khoche, Khoche Consulting Services |
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| R. Kapur, Verigy |
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| A. Gold, Advantest |
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| F.-F. Ferhani, Broadcom |
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| D. Acharyya, Verigy |
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| K. Lanier, Teradyne |
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| R. Barth, Numonyx |
| B. Brown, LTX-Credence |
| P. Burlison, Inovys |
| C. J. Clark, Intellitech |
| A. Evans, Broadcom |
| W. Fister, Micron |
| G. Fleeman, Advantest |
| B. Gage, Teradyne |
| A. Gold, Advantest |
| M. Hafed, DFT Microsystems |
| R. Kapur, Synopsys |
| D. Keezer, GeorgiaTech |
| R. Lesnikoski, Oracle |
| Y. Ma, Advantest |
| J. Moreira, Verigy |
| P. Muhmenthaler, MUHMY Systems |
| J. Plusquellic, University of New Mexico |
| B. Price, NXP |
| M. Roos, Roos Instruments |
| J. Rivoir, Verigy |
| S. Tilden, LTX-Credence |
| N. Touba, University of Texas |
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