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General Chair
E. Volkerink, Verigy
Vice General Chair
S. Davidson, SUN Microsystem
Program Chair
D. Armstrong, Advantest
Program Vice Chair
B. Brown, LTX-Credence
Panel Chair
A. Khoche, Consultant
Finance Chair and IEEE Liaison
R. Chandramouli, ARM
Sponsoring Chair
Y. Ma, Advantest
Marketing Chair
A. Gold, Advantest
Registration Chair and SEMICON Liaison
R. Kapur, Synopsys
Marketing Vice Chair
F.-F. Ferhani, Broadcom
Local Arrangements Chair
D. Acharyya, Verigy
Program Committee
R. Barth, Numonyx
P. Burlison, Inovys
K.-Y. Cho, NVIDIA
C. J. Clark, Intellitech
A. Evans, Broadcom
W. Fister, Micron
G. Fleeman, Advantest
B. Gage, Teradyne
M. Hafed, DFT Microsystems
R. Kapur, Synopsys
D. Keezer, GeorgiaTech
R. Lesnikoski, Sun Microsystems
Y. Ma, Advantest
J. Moreira, Verigy
P. Muhmenthaler, MUHMY Systems
J. Plusquellic, University of New Mexico
B. Price, NXP
M. Roos, Roos Instruments
J. Rivoir, Verigy
N. Touba, University of Texas
C.W. Wu, Tsing Hua University

2nd IEEE International Workshop on
Automated Test Equipment: Vision ATE 2020
Santa Clara Convention Center, Santa Clara, California, USA
October 25-26, 2007
Held in conjunction with TestWeek (International Test Conference 2008)


Downloadable Program Here!

Thursday, October 30, 2008

Session 1 - ATE Vision Opening
4:00pm - 4:05pm Opening Remarks 
Erik Volkerink, General Chair
4:05pm - 4:10pm Opening Remarks 
Scott Davidson Program Chair
4:10pm - 5:00pm Keynote Address
Octavio Martinez, Director of Test Engineering, Qualcomm
5:00pm - 6:30pm Panel: Creating Sustainable Growth: Trick or Treat!!!
Chair: Rick Nelson, Test & Measurement World
Panelists:
        Brad Robbins, Teradyne
        Deb Ahlgren, Verigy
        Gary Fleeman, Advantest
        Dan Glotter, OptimalTest
Organizer: Ajay Khoche, Verigy
7:00pm - 8:30pm Reception, Santa Clara Convention Center, Ballroom E & F
Friday, October 31, 2008
7:00am - 8:00am

Breakfast

Session 2 – ATE Architectures of the Future
Chair: Dave Keezer, Georgia Tech
8:00am - 8:30am 2.1 Driving Industry Collaboration to the Next Level
Paul Roddy, Advantest
8:30am - 9:00am 2.2 Functional ATE Architecture for the Next 10 Years  
Ronald Lesnikoski, Sun Microsystems
9:00am - 9:30am 2.3 The Configurable Modular Tester (CMT)  
Mark Roos, Roos Instruments
9:30am - 10:00am 2.4 A Path to Efficiency  
Kris Hublitz and Andy Evans, Broadcomm
10:00am - 10:30am Break 
Session 3 –New Concepts in Testing
Chair:
10:30am - 11:00am 3.1 Future of Testing = Adapt Evolve Win  
John Bearden and Gil Balog, OptimalTest
11:00am - 11:30am 3.2 At-Speed Loopback Testing: Strategies and Techniques  
Jose Moreira, Joerg Walter Mohr and Roger Nettles, Verigy
11:30am - 12:00pm 3.3 To Wire or Not to Wire?-That is the Question!  
Chih-Tsun Huang, National Tsing-Hua University  
12:00pm - 1:00pm Lunch
Session 4 – The Future of Test
Chair: Mike Kondrat, Cascade Microtech
1:00pm - 1:30pm 4.1 Forecast: Discontinuities  
Eric Strid, Cascade Microtech
1:30pm - 2:00pm 4.2 Test and DFT Challenges for the "More than Moore" Era  
Prasad Matnri, Sun Microsystems ;
2:00pm - 2:30pm 4.3 What Will a Typical IC Test Program Look Like in 2015?  
Phil Burlison, Verigy
2:30pm - 3:00pm Break 
Session 5 – ATE & EDA
Chair:
3:00pm - 3:30pm 5.1 Integrating ATE Test In The Design Flow - Closing The CAE / ATE Gap  
Kirit Khichadia, Simutest
3:30pm - 4:00pm 5.2 Consideration of ATE Simulation in EDA Environment  
Yuhai Ma, Advantest

4:00pm - 4:30pm 5.3 An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization  
D. Appello *, P. Bernardi ***, M. Bruno ***, R. Cagliesi **, M. Giancarlini **, M. Grosso ***, E. Sanchez *** and M. Sonza Reorda ***, * ST Microelectronics, ** ELES Semiconductor Equipment, Todi, ***Politecnico Torino
4:30pm Raffle for Attendees &Open Mike & Adjourn
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