| E. Volkerink, Verigy |
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| S. Davidson, Oracle |
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| D. Armstrong, Advantest |
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| B. Brown, LTX-Credence |
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| A. Khoche, Khoche Consulting Services |
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| R. Kapur, Synopsys |
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| Y. Ma, Advantest |
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| A. Gold, Advantest |
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| F.-F. Ferhani, Broadcom |
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| D. Acharyya, Verigy |
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| R. Barth, Micron |
| P. Burlison, Verigy |
| K.-Y. Cho, NVIDIA |
| C. J. Clark, Intellitech |
| A. Evans, Broadcom |
| W. Fister, Micron |
| G. Fleeman, Advantest |
| B. Gage, Teradyne |
| M. Hafed, DFT Microsystems |
| R. Kapur, Synopsys |
| D. Keezer, GeorgiaTech |
| K. Lanier, Teradyne |
| R. Lesnikoski, Oracle |
| M. Loranger, FormFactor |
| Y. Ma, Advantest |
| J. Moreira, Verigy |
| P. Muhmenthaler, MUHMY Systems |
| J. Plusquellic, University of New Mexico |
| B. Price, NXP |
| M. Roos, Roos Instruments |
| J. Rivoir, Verigy |
| S. Tilden, LTX-Credence |
| C.W. Wu, Tsing Hua University |
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Downloadable Program Here!
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Session 1 - ATE Vision 2020 Opening
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8:30am 8:35am
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Opening
Remarks
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Erik
Volkerink, General Chair
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8:35am 8:40am
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Opening Remarks
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Dave
Armstrong, Program Chair
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8:40am
9:30am
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Keynote
Address: ATE Countdown
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Ron
Leckie, Infrastructure Advisors
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9:30am 10:00am
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Break
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Session
2 – Innovative Test Methodologies
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Chair: Dave Armstrong, Advantest
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10:00am 10:30am
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1.1
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Closing
the Structural/Functional Test Gap
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Han
Ta, Cisco
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10:30am 11:00am
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1.2
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Expanding
test coverage at sort to reduce overall product cost
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Larry
Levy, FormFactor
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11:00am 11:30am
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1.3
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KGD
Test and Challenges and solutions for TSV based devices
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Marc
Loranger, FormFactor
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11:30am 12:00pm
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1.4
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3D
Test Challenges and Probing Concepts
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Stojan Kanev,
Cascade Microtech
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12:00pm 1:00pm
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Lunch
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Session
3 - Test Requirements 2020 Panel
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Moderator: Dan Hutcheson
VLSI Research
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1:00pm 2:00pm
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Panelists:
Pete
Hodakievic, AMD
Adam
Wright, Altera
Roger
Barth, Micron
Muru Yogathsan, StatsChipPac
Andy Evans, Broadcom
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2:00pm 2:30pm
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Break
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Session
4 - Breakthroughs in Test Software
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Chair: Ken Lanier, Teradyne
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2:30pm 3:00pm
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4.1
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Adaptive
Test Today and + 20
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Robert
Daasch, Portland
State University
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3:00pm 3:30pm
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4.2
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Beyond
pass/fail test: The EDA perspective on the role of ATE
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Geir Eide,
Mentor
Graphics
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3:30pm 4:00pm
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Break
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Session
5 - Reducing Cost of Test
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Chair: Ben Brown, LTX-Credence
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4:00pm 4:30pm
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5.1
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Towards
a Universal Digital Pin Architecture: From DC to 10GHz+
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Mohamed
Hafed, DFT Microsystems
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4:30pm 5:00pm
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5.2
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Multi-system
Architecture: A New Twist in Cost-of-Test Management
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Len
Van Eck, LTX-Credence
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5:00pm 5:30pm
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5.3
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Welcome
(Back) To Functional Test
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Ken
Lanier, Teradyne
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5:30pm 6:00pm
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Break
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Session
6: Test Solutions 2020 Panel
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Moderator:
Rick Nelson
Test & Measurement World
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6:00pm 7:00pm
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Panelists:
Gary Fleeman,
Advantest
Erik
Volkerink, Verigy
Jack
O'Brien, Teradyne
Steve
Wigley, LTX-Credence
Ben Eldridge, FormFactor
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7:00pm
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Open Mike & Adjourn
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Register Now 
