3rd IEEE International Workshop on Automated Test Equipment: ATEVision 2020 San Francisco Marriott Marquis July 15, 2010 Held in conjunction with SEMICON West 2010

The goal of this workshop is to create an informal forum to discuss those innovations relevant to ATE developers and users. We are looking for solutions and ideas for solutions to the issues we will run into in the 2012/2013 timeframe. What do we need to do differently? What will an ATE need to look like in 2015 and 2020? Are our present technologies adequate for the future and if not what should be doing to close the gap? This workshop is unique. We're not necessarily looking for a standard paper filled with results; we are looking for speculation and creative brainstorming ideas. Let's challenge ourselves and each other. Representative topics include, but are not limited to: Critical "future-proof" ATE capabilities Test methods for future defects 3D device testing ideas and techniques Power testing needs for Green technology Protocol Aware Techniques High-speed IO Test Insuring test quality while minimizing test cost RF and SOC testing trends Adaptive & concurrent testing challenges Test program generation ideas Ways to streamline our test efforts Killer ATE Product Ideas Author information To present at the workshop, authors are invited to submit presentation proposals. The proposals may be draft presentations, extended abstracts (500 words), or full papers. Each submission should include: title, full name and affiliation of all authors, a short abstract of 50 words, and keywords. Also, identify a contact author and include a complete correspondence address, phone, fax and e-mail. In addition to traditional 20-30 minute presentations we are also looking this year for some quick 5-10 minute elevator-pitch presentations. These would be an ideal opportunity to pitch a new product idea to a team of mock venture-capitalists in order to explore (in fun) the potential value of your product concept. Submit a copy of your presentation proposal by Postscript, or PDF, via Email. Proposals for panel discussions are also invited. Submissions are due no later than May 7, 2010. Submit your proposals to: Dave Armstrong, Advantest E-Mail: D.Armstrong@Advantest.com Tel: +1-303-665-5227 Authors will be notified of the disposition of their presentation by June 4, 2010. 2010 and must submit the final presentation by June 18, 2010 for inclusion in the Workshop Notes, which will be provided to the attendees on a memory stick. Optionally, an extended abstract or paper can also be included in the notes. ATE Vision 2020 is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC).