4th IEEE International Workshop on
Automated Test Equipment: ATEVision 2020

San Francisco Marriott Marquis
July 14, 2011
Held in conjunction with SEMICON West 2011

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General Chair
E. Volkerink, Verigy
Vice General Chair
D. Armstrong, Advantest
Program Chair
M. Loranger, FormFactor
Vice Program Chair
A. Khoche, Khoche Consulting Services
Finance Chair and IEEE Liaison
R. Kapur, Verigy
Marketing Chair
A. Gold, Advantest
Communications Chair
F.-F. Ferhani, Broadcom
Local Arrangement Chair and SEMI Liaison
D. Acharyya, Verigy
Sponsoring Chair
K. Lanier, Teradyne
Program Committee
R. Barth, Numonyx
B. Brown, LTX-Credence
P. Burlison, Inovys
C. J. Clark, Intellitech
A. Evans, Broadcom
W. Fister, Micron
G. Fleeman, Advantest
B. Gage, Teradyne
A. Gold, Advantest
M. Hafed, DFT Microsystems
R. Kapur, Synopsys
D. Keezer, GeorgiaTech
R. Lesnikoski, Oracle
Y. Ma, Advantest
J. Moreira, Verigy
P. Muhmenthaler, MUHMY Systems
J. Plusquellic, University of New Mexico
B. Price, NXP
M. Roos, Roos Instruments
J. Rivoir, Verigy
S. Tilden, LTX-Credence
N. Touba, University of Texas

The goal of this workshop is to create an informal forum to discuss those innovations relevant to ATE developers and users. We are looking for solutions and ideas for solutions to the issues we will run into in the 2013/2014 timeframe. What do we need to do differently? What will an ATE need to look like in 2020? Are our present technologies adequate for the future and if not what should be doing to close the gap?

This workshop is unique. We're not necessarily looking for a standard paper filled with results; we are looking for speculation and creative brainstorming ideas. Let's challenge ourselves and each other.

Representative topics include, but are not limited to:

  • Critical "future-proof" ATE capabilities
  • Test methods for future defects
  • 3D device testing ideas and techniques
  • Power testing needs for Green technology
  • Protocol Aware Techniques
  • High-speed IO Test
  • Insuring test quality while minimizing test cost
  • RF and SOC testing trends
  • Adaptive & concurrent testing challenges
  • Test program generation ideas
  • Ways to streamline our test efforts
  • Killer ATE Product Ideas

Author information

To present at the workshop, authors are invited to submit presentation proposals. The proposals may be draft presentations, extended abstracts (500 words), or full papers. Each submission should include: title, full name and affiliation of all authors, a short abstract of 50 words, and keywords. Also, identify a contact author and include a complete correspondence address, phone, fax and e-mail.

In addition to traditional 20-30 minute presentations we are also looking this year for some quick 5-10 minute elevator-pitch presentations. These would be an ideal opportunity to pitch a new product idea to a team of mock venture-capitalists in order to explore (in fun) the potential value of your product concept.

Submit a copy of your presentation proposal by Postscript, or PDF, via Email. Proposals for panel discussions are also invited. Submissions are due no later than May 6, 2011.
Submit your proposals to:

Mark Loranger, FormFactor E-Mail: MLoranger@formfactor.com

Authors will be notified of the disposition of their presentation by June 3, 2011.

and must submit the final presentation by June 17, 2011 for inclusion in the Workshop Notes, which will be provided to the attendees on a memory stick. Optionally, an extended abstract or paper can also be included in the notes. ATE Vision 2020 is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC).

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