| E. Volkerink, Verigy |
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| D. Armstrong, Advantest |
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| M. Loranger, FormFactor |
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| A. Khoche, Khoche Consulting Services |
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| R. Kapur, Verigy |
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| A. Gold, Advantest |
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| F.-F. Ferhani, Broadcom |
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| D. Acharyya, Verigy |
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| K. Lanier, Teradyne |
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| R. Barth, Numonyx |
| B. Brown, LTX-Credence |
| P. Burlison, Inovys |
| C. J. Clark, Intellitech |
| A. Evans, Broadcom |
| W. Fister, Micron |
| G. Fleeman, Advantest |
| B. Gage, Teradyne |
| A. Gold, Advantest |
| M. Hafed, DFT Microsystems |
| R. Kapur, Synopsys |
| D. Keezer, GeorgiaTech |
| R. Lesnikoski, Oracle |
| Y. Ma, Advantest |
| J. Moreira, Verigy |
| P. Muhmenthaler, MUHMY Systems |
| J. Plusquellic, University of New Mexico |
| B. Price, NXP |
| M. Roos, Roos Instruments |
| J. Rivoir, Verigy |
| S. Tilden, LTX-Credence |
| N. Touba, University of Texas |
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Successful ATEVision 2020 Semicon West 2010 Workshop
As one of the corporate sponsors of the ATEVision 2020 Workshop at Semicon West 2010 last week (along with ATE vendors Advantest, LTX-Credence, Teradyne, Verigy, as well as Form Factor), we were very pleased with the attendance and content. The workshop was attended by some of the industry's best thinkers from a variety of companies, including Broadcom, Cisco, Form Factor, Intel, Graphics, Mentor Graphics, Micron, Mnemonics, National, nVidia, Oracle, and Qualcomm.
We were happy to see that adaptive test is a topic that is in demand, as is using more data analysis as part of system level test. Other prominent topics included but were not limited to: Critical "future-proof" ATE capabilities; test methods for future defects; 3D device testing; ensuring test quality while minimizing test cost; RF and SoC testing trends; adaptive and concurrent testing challenges; test program generation ideas.
In addition, there were two good panel sessions. In Session 1, moderated by Dan Hutcheson, CEO of VLSI Research, major ATE customers described future ATE needs. A few key takeaways:
Time to market is key. Of increasing importance is data and tools to extract what is important. Customers are willing to invest in value-added software. System-level test is becoming more important. With DFT and protocol testing there is no longer a need for very expensive testers. Need to work toward shipping devices with 100 ppm. More test is moving into probe, where probing efficiencies can be better than Final Test. In Session 2, moderated by Rick Nelson, Editor-in-Chief of Test & Measurement World and EDN, ATE company panelists addressed the customer future customer needs from Session 1.
Interesting papers rounded out the Workshop's look at the future of ATE. We were particularly interested in Rob Daasch's paper about adaptive test and Geir Eide's paper about test program generation ideas - it's worth taking a look at the papers presented. Many thanks to the IEEE, IEEE Computer Society, other sponsors, participants and everyone who made it such a worthwhile event!
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